Aberration-corrected electron microscopy of nanoparticles
The early history of scanning transmission electron microscopy (STEM) is reviewed as a way to frame the technical issues that make aberration correction an essential upgrade for the study of nanoparticles using STEM. The principles of aberration correction are explained, and the use of aberration-...
| Autores principales: | , , |
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| Formato: | Sección de libro. |
| Lenguaje: | inglés |
| Publicado: |
Springer International Publishing
2015
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| Materias: | |
| Acceso en línea: | http://eprints.uanl.mx/8894/1/Aberration-Corrected%20Electron%20Microscopy%20of%20Nanoparticles.pdf |
| Sumario: | The early history of scanning transmission electron microscopy (STEM) is reviewed as a way to frame the technical issues that make aberration correction an essential upgrade for the study of nanoparticles using STEM. The principles of aberration correction are
explained, and the use of aberration-corrected microscopy in the study of nanostructures is exemplified in order to remark the features and challenges in the use of this measuring technique |
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