Aberration-corrected electron microscopy of nanoparticles
The early history of scanning transmission electron microscopy (STEM) is reviewed as a way to frame the technical issues that make aberration correction an essential upgrade for the study of nanoparticles using STEM. The principles of aberration correction are explained, and the use of aberration-...
| Päätekijät: | , , |
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| Aineistotyyppi: | Sección de libro. |
| Kieli: | English |
| Julkaistu: |
Springer International Publishing
2015
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| Aiheet: | |
| Linkit: | http://eprints.uanl.mx/8894/1/Aberration-Corrected%20Electron%20Microscopy%20of%20Nanoparticles.pdf |