Aberration-corrected electron microscopy of nanoparticles

The early history of scanning transmission electron microscopy (STEM) is reviewed as a way to frame the technical issues that make aberration correction an essential upgrade for the study of nanoparticles using STEM. The principles of aberration correction are explained, and the use of aberration-...

詳細記述

書誌詳細
主要な著者: Yacamán, Miguel José, Santiago, Ulises, Mejía Rosales, Sergio
フォーマット: Sección de libro.
言語:English
出版事項: Springer International Publishing 2015
主題:
オンライン・アクセス:http://eprints.uanl.mx/8894/1/Aberration-Corrected%20Electron%20Microscopy%20of%20Nanoparticles.pdf