Aberration-corrected electron microscopy of nanoparticles
The early history of scanning transmission electron microscopy (STEM) is reviewed as a way to frame the technical issues that make aberration correction an essential upgrade for the study of nanoparticles using STEM. The principles of aberration correction are explained, and the use of aberration-...
主要な著者: | , , |
---|---|
フォーマット: | Sección de libro. |
言語: | English |
出版事項: |
Springer International Publishing
2015
|
主題: | |
オンライン・アクセス: | http://eprints.uanl.mx/8894/1/Aberration-Corrected%20Electron%20Microscopy%20of%20Nanoparticles.pdf |