Cita APA (7a ed.)

Yacamán, M. J., Santiago, U., & Mejía Rosales, S. (2015). Aberration-corrected electron microscopy of nanoparticles. Springer International Publishing.

Cita Chicago Style (17a ed.)

Yacamán, Miguel José, Ulises Santiago, y Sergio Mejía Rosales. Aberration-corrected Electron Microscopy of Nanoparticles. Springer International Publishing, 2015.

Cita MLA (9a ed.)

Yacamán, Miguel José, et al. Aberration-corrected Electron Microscopy of Nanoparticles. Springer International Publishing, 2015.