Aberration-corrected electron microscopy of nanoparticles
The early history of scanning transmission electron microscopy (STEM) is reviewed as a way to frame the technical issues that make aberration correction an essential upgrade for the study of nanoparticles using STEM. The principles of aberration correction are explained, and the use of aberration-...
| Main Authors: | , , |
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| Format: | Sección de libro. |
| Language: | English |
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Springer International Publishing
2015
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| Subjects: | |
| Online Access: | http://eprints.uanl.mx/8894/1/Aberration-Corrected%20Electron%20Microscopy%20of%20Nanoparticles.pdf |
| _version_ | 1824370860444614656 |
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| author | Yacamán, Miguel José Santiago, Ulises Mejía Rosales, Sergio |
| author_facet | Yacamán, Miguel José Santiago, Ulises Mejía Rosales, Sergio |
| author_sort | Yacamán, Miguel José |
| collection | Repositorio Institucional |
| description | The early history of scanning transmission electron microscopy (STEM) is reviewed as a way to frame the technical issues that make aberration correction an essential upgrade for the study of nanoparticles using STEM. The principles of aberration correction are
explained, and the use of aberration-corrected microscopy in the study of nanostructures is exemplified in order to remark the features and challenges in the use of this measuring technique |
| format | Sección de libro. |
| id | eprints-8894 |
| institution | UANL |
| language | English |
| publishDate | 2015 |
| publisher | Springer International Publishing |
| record_format | eprints |
| spelling | eprints-88942016-12-06T15:38:08Z http://eprints.uanl.mx/8894/ Aberration-corrected electron microscopy of nanoparticles Yacamán, Miguel José Santiago, Ulises Mejía Rosales, Sergio QC Física The early history of scanning transmission electron microscopy (STEM) is reviewed as a way to frame the technical issues that make aberration correction an essential upgrade for the study of nanoparticles using STEM. The principles of aberration correction are explained, and the use of aberration-corrected microscopy in the study of nanostructures is exemplified in order to remark the features and challenges in the use of this measuring technique Springer International Publishing 2015 Sección de libro. PeerReviewed text en cc_by_nc_nd http://eprints.uanl.mx/8894/1/Aberration-Corrected%20Electron%20Microscopy%20of%20Nanoparticles.pdf http://eprints.uanl.mx/8894/1.haspreviewThumbnailVersion/Aberration-Corrected%20Electron%20Microscopy%20of%20Nanoparticles.pdf Yacamán, Miguel José y Santiago, Ulises y Mejía Rosales, Sergio (2015) Aberration-corrected electron microscopy of nanoparticles. In: Aberration-corrected electron microscopy of nanoparticles. Springer International Publishing, Cham, pp. 1-29. ISBN 9783319151779 |
| spellingShingle | QC Física Yacamán, Miguel José Santiago, Ulises Mejía Rosales, Sergio Aberration-corrected electron microscopy of nanoparticles |
| thumbnail | https://rediab.uanl.mx/themes/sandal5/images/online.png |
| title | Aberration-corrected electron microscopy of nanoparticles |
| title_full | Aberration-corrected electron microscopy of nanoparticles |
| title_fullStr | Aberration-corrected electron microscopy of nanoparticles |
| title_full_unstemmed | Aberration-corrected electron microscopy of nanoparticles |
| title_short | Aberration-corrected electron microscopy of nanoparticles |
| title_sort | aberration corrected electron microscopy of nanoparticles |
| topic | QC Física |
| url | http://eprints.uanl.mx/8894/1/Aberration-Corrected%20Electron%20Microscopy%20of%20Nanoparticles.pdf |
| work_keys_str_mv | AT yacamanmigueljose aberrationcorrectedelectronmicroscopyofnanoparticles AT santiagoulises aberrationcorrectedelectronmicroscopyofnanoparticles AT mejiarosalessergio aberrationcorrectedelectronmicroscopyofnanoparticles |