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Aberration-corrected electron microscopy of nanoparticles

The early history of scanning transmission electron microscopy (STEM) is reviewed as a way to frame the technical issues that make aberration correction an essential upgrade for the study of nanoparticles using STEM. The principles of aberration correction are explained, and the use of aberration-...

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Bibliographic Details
Main Authors:	Yacamán, Miguel José, Santiago, Ulises, Mejía Rosales, Sergio
Format:	Sección de libro.
Language:	English
Published:	Springer International Publishing 2015
Subjects:	QC Física
Online Access:	http://eprints.uanl.mx/8894/1/Aberration-Corrected%20Electron%20Microscopy%20of%20Nanoparticles.pdf

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