Yacamán, M. J., Santiago, U., & Mejía Rosales, S. (2015). Aberration-corrected electron microscopy of nanoparticles. Springer International Publishing.
Chicago Style (17th ed.) CitationYacamán, Miguel José, Ulises Santiago, and Sergio Mejía Rosales. Aberration-corrected Electron Microscopy of Nanoparticles. Springer International Publishing, 2015.
MLA (9th ed.) CitationYacamán, Miguel José, et al. Aberration-corrected Electron Microscopy of Nanoparticles. Springer International Publishing, 2015.
Warning: These citations may not always be 100% accurate.