| Summary: | This study compares the Eddy current technique and optical microscopy for measuring
the anodized layer thickness in a 6063 aluminum alloy with the aim of establishing an
efficient and accurate methodology capable of delivering optimal results in a time-efficient
manner. Optical microscopy was used as the reference method, with five measurements
taken in different fields for each specimen. The Eddy current method was applied using
two calibration strategies: one calibration before each measurement and another after every
ten specimens. The Bland–Altman analysis was employed to compare both measurement
techniques. The results indicated that the calibration before each measurement strategy
using Eddy current showed higher agreement with the reference method, suggesting that
both techniques can be considered equivalent and interchangeable. Furthermore, the Eddy
current method demonstrated significant advantages in detecting thickness variations
along the specimen, revealing non-uniform distribution of the anodized layer. This method
also proved to be faster and eliminated the need for metallographic preparation required
by optical microscopy, thus significantly reducing analysis time and cost. In conclusion, the
Eddy current method with calibration before each measurement strategy is proposed as an
effective alternative for measuring anodized layer thickness in applications where speed
and precision are critical.
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