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aleación Cu-Al
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conductividad eléctrica
envejecimiento artificial
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microestructura
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recubrimiento dielectrico
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Análisis microestructural y conductividad eléctrica del dieléctrico en conductor de Cu- Al modificado por envejecimiento artificial térmico
by
Hernández, Francisco
,
Vargas , Benjamín
,
Estrella , Veronica
,
Aguilar , Miriam
,
Palacios, Nadxiel
Published 2019
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Institution
UANL
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Article
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Aguilar , Miriam
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Estrella , Veronica
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Hernández, Francisco
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Palacios, Nadxiel
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Vargas , Benjamín
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Language
Spanish
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