Estimating resistive and dielectric effects during microwave heating of Fe0.22Ni0.67Mn2.11O4
Dielectric approaches for estimating microwave heating of ceramics and polymers assuming that resistive effects are small enough to be neglected have been applied quite often. However, these approaches are not valid for semiconductors. Permittivity and resistivity are very sensitive to chemical comp...
| Autores principales: | , , |
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| Formato: | Artículo |
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2009
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| _version_ | 1824420787849789440 |
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| author | Aguilar Garib, Juan Antonio García, Felipe Valdez Nava, Zarel |
| author_facet | Aguilar Garib, Juan Antonio García, Felipe Valdez Nava, Zarel |
| author_sort | Aguilar Garib, Juan Antonio |
| collection | Repositorio Institucional |
| description | Dielectric approaches for estimating microwave heating of ceramics and polymers assuming that resistive effects are small enough to be neglected have been applied quite often. However, these approaches are not valid for semiconductors. Permittivity and resistivity are very sensitive to chemical composition; therefore it is difficult to extrapolate properties from similar materials as can be done with thermal properties. The objective of this work is to estimate the dielectric and resistive contributions during microwave heating, solving the electromagnetic and heat transfer equations by means of Finite Element Method (FEM) using the software ANSYSTM. The experiments were performed over a parallelepiped made of compacted and sintered powders of the manganite, which is a negative thermal coefficient thermistor, placed inside a waveguide and exposed to 2.45 GHz microwaves at different powers. Temperature was taken with sheathed thermocouples that also served as electrodes for monitoring electric resistance. Matching experimental data and simulation results provided values for the properties within acceptable range. An operative model for simulating heating of a sample placed in a waveguide was built, considering either resistive or dielectric effects, which in turn helps to estimate these properties applying it jointly with the experimental technique shown. |
| format | Article |
| id | eprints-27637 |
| institution | UANL |
| publishDate | 2009 |
| record_format | eprints |
| spelling | eprints-276372024-12-10T16:25:44Z http://eprints.uanl.mx/27637/ Estimating resistive and dielectric effects during microwave heating of Fe0.22Ni0.67Mn2.11O4 Aguilar Garib, Juan Antonio García, Felipe Valdez Nava, Zarel TK Ingeniería Eléctrica, Electrónica, Ingeniería Nuclear Dielectric approaches for estimating microwave heating of ceramics and polymers assuming that resistive effects are small enough to be neglected have been applied quite often. However, these approaches are not valid for semiconductors. Permittivity and resistivity are very sensitive to chemical composition; therefore it is difficult to extrapolate properties from similar materials as can be done with thermal properties. The objective of this work is to estimate the dielectric and resistive contributions during microwave heating, solving the electromagnetic and heat transfer equations by means of Finite Element Method (FEM) using the software ANSYSTM. The experiments were performed over a parallelepiped made of compacted and sintered powders of the manganite, which is a negative thermal coefficient thermistor, placed inside a waveguide and exposed to 2.45 GHz microwaves at different powers. Temperature was taken with sheathed thermocouples that also served as electrodes for monitoring electric resistance. Matching experimental data and simulation results provided values for the properties within acceptable range. An operative model for simulating heating of a sample placed in a waveguide was built, considering either resistive or dielectric effects, which in turn helps to estimate these properties applying it jointly with the experimental technique shown. 2009 Article PeerReviewed Aguilar Garib, Juan Antonio y García, Felipe y Valdez Nava, Zarel (2009) Estimating resistive and dielectric effects during microwave heating of Fe0.22Ni0.67Mn2.11O4. Journal of the Ceramic Society of Japan, 117 (1367). pp. 801-807. ISSN 1882-0743 http://doi.org/10.2109/jcersj2.117.801 doi:10.2109/jcersj2.117.801 |
| spellingShingle | TK Ingeniería Eléctrica, Electrónica, Ingeniería Nuclear Aguilar Garib, Juan Antonio García, Felipe Valdez Nava, Zarel Estimating resistive and dielectric effects during microwave heating of Fe0.22Ni0.67Mn2.11O4 |
| thumbnail | https://rediab.uanl.mx/themes/sandal5/images/online.png |
| title | Estimating resistive and dielectric effects during microwave heating of Fe0.22Ni0.67Mn2.11O4 |
| title_full | Estimating resistive and dielectric effects during microwave heating of Fe0.22Ni0.67Mn2.11O4 |
| title_fullStr | Estimating resistive and dielectric effects during microwave heating of Fe0.22Ni0.67Mn2.11O4 |
| title_full_unstemmed | Estimating resistive and dielectric effects during microwave heating of Fe0.22Ni0.67Mn2.11O4 |
| title_short | Estimating resistive and dielectric effects during microwave heating of Fe0.22Ni0.67Mn2.11O4 |
| title_sort | estimating resistive and dielectric effects during microwave heating of fe0 22ni0 67mn2 11o4 |
| topic | TK Ingeniería Eléctrica, Electrónica, Ingeniería Nuclear |
| work_keys_str_mv | AT aguilargaribjuanantonio estimatingresistiveanddielectriceffectsduringmicrowaveheatingoffe022ni067mn211o4 AT garciafelipe estimatingresistiveanddielectriceffectsduringmicrowaveheatingoffe022ni067mn211o4 AT valdeznavazarel estimatingresistiveanddielectriceffectsduringmicrowaveheatingoffe022ni067mn211o4 |