Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT)
Abstract: Multilayer ceramic capacitors (MLCC) are essential components for determining the reliability of electronic components in terms of time to failure. It is known that the reliability of MLCCs depends on their composition, processing, and operating conditions. In this present work, we analyze...
| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
2018
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| Online Access: | http://eprints.uanl.mx/15986/1/59.pdf |
| _version_ | 1824414454797828096 |
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| author | Hernández López, Ana María Aguilar Garib, Juan Antonio Guillemet Fritsch, Sophie Nava Quintero, Román Jabir Dufour, Pascal Tenailleau, Christophe Durand, Bernard Valdez Nava, Zarel |
| author_facet | Hernández López, Ana María Aguilar Garib, Juan Antonio Guillemet Fritsch, Sophie Nava Quintero, Román Jabir Dufour, Pascal Tenailleau, Christophe Durand, Bernard Valdez Nava, Zarel |
| author_sort | Hernández López, Ana María |
| collection | Repositorio Institucional |
| description | Abstract: Multilayer ceramic capacitors (MLCC) are essential components for determining the reliability of electronic components in terms of time to failure. It is known that the reliability of MLCCs depends on their composition, processing, and operating conditions. In this present work, we analyzed the lifetime of three similar X7R type MLCCs based on BaTiO3 by conducting High Accelerated Life Tests (HALT) at temperatures up to 200 ◦C at 400 V and 600 V. The results were adjusted to an Arrhenius equation, which is a function of the activation energy (Ea) and a voltage stress exponent (n), in order to predict their time to failure. The values of Ea are in the range of 1–1.45 eV, which has been reported for the thermal failure and dielectric wear out of BaTiO3-based dielectric capacitors. The stress voltage exponent value was in the range of 4–5. Although the Ea can be associated with a failure mechanism, n only gives an indication of the effect of voltage in the tests. It was possible to associate those values with each type of tested MLCC so that their expected life could be estimated in the range of 400–600 V. |
| format | Article |
| id | eprints-15986 |
| institution | UANL |
| language | English |
| publishDate | 2018 |
| record_format | eprints |
| spelling | eprints-159862024-03-05T17:23:48Z http://eprints.uanl.mx/15986/ Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT) Hernández López, Ana María Aguilar Garib, Juan Antonio Guillemet Fritsch, Sophie Nava Quintero, Román Jabir Dufour, Pascal Tenailleau, Christophe Durand, Bernard Valdez Nava, Zarel Abstract: Multilayer ceramic capacitors (MLCC) are essential components for determining the reliability of electronic components in terms of time to failure. It is known that the reliability of MLCCs depends on their composition, processing, and operating conditions. In this present work, we analyzed the lifetime of three similar X7R type MLCCs based on BaTiO3 by conducting High Accelerated Life Tests (HALT) at temperatures up to 200 ◦C at 400 V and 600 V. The results were adjusted to an Arrhenius equation, which is a function of the activation energy (Ea) and a voltage stress exponent (n), in order to predict their time to failure. The values of Ea are in the range of 1–1.45 eV, which has been reported for the thermal failure and dielectric wear out of BaTiO3-based dielectric capacitors. The stress voltage exponent value was in the range of 4–5. Although the Ea can be associated with a failure mechanism, n only gives an indication of the effect of voltage in the tests. It was possible to associate those values with each type of tested MLCC so that their expected life could be estimated in the range of 400–600 V. 2018-10-04 Article PeerReviewed text en cc_by_nc_nd http://eprints.uanl.mx/15986/1/59.pdf http://eprints.uanl.mx/15986/1.haspreviewThumbnailVersion/59.pdf Hernández López, Ana María y Aguilar Garib, Juan Antonio y Guillemet Fritsch, Sophie y Nava Quintero, Román Jabir y Dufour, Pascal y Tenailleau, Christophe y Durand, Bernard y Valdez Nava, Zarel (2018) Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT). Materials, 11 (10). pp. 1-14. ISSN 1996-1944 http://doi.org/10.3390/ma11101900 doi:10.3390/ma11101900 |
| spellingShingle | Hernández López, Ana María Aguilar Garib, Juan Antonio Guillemet Fritsch, Sophie Nava Quintero, Román Jabir Dufour, Pascal Tenailleau, Christophe Durand, Bernard Valdez Nava, Zarel Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT) |
| thumbnail | https://rediab.uanl.mx/themes/sandal5/images/online.png |
| title | Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT) |
| title_full | Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT) |
| title_fullStr | Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT) |
| title_full_unstemmed | Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT) |
| title_short | Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT) |
| title_sort | reliability of x7r multilayer ceramic capacitors during high accelerated life testing halt |
| url | http://eprints.uanl.mx/15986/1/59.pdf |
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